Infrared spectroscopy (IRS) is a powerful analytical method with high detection and chemical sensitivity. It has been used in the characterisation of semiconductor interfaces for decades. A special advantage of IRS is its sensitivity not only for molcular vibrations, but also for excitations of free charge carriers. Hence, it offers the possibility to gain information on the electrical conductivity of a sample without the need for direct contacts.
Infrared ellipsometer Woollam IR-VASE
- spectral range: 333-6000 cm-1
- max. resolution: 1 cm-1
- angle of incidence: 26°-90°
Instec hot/cold stage
- Temperature range: 110-870 K
- Can be evacuated
Topics of our research involving IR ellipsometry
If you are interested in further information or in a collaboration please contact Prof. Annemarie Pucci.