KIP publications

 
year 2017
author(s) Akemi Tamanai and Thang Duy Dao and Michael Sendner and Tadaaki Nagao and Annemarie Pucci
title Mid-infrared optical and electrical properties of indium tin oxide films
KIP-Nummer HD-KIP 16-107
KIP-Gruppe(n) F6
document type Paper
Keywords dielectric functions, indium tin oxide, IR ellipsometry, sputtering
source physica status solidi (a) 214 (2017) 3, 1600467
doi 10.1002/pssa.201600467
Abstract (en)

Mid-infrared (MIR) optical properties of six various types of indium tin oxide (ITO) films have been investigated by means of infrared spectroscopic ellipsometry. We utilized both commercially available and uniquely fabricated ITO films which are composed of mainly two types of structures, “grain” and “grain-subgrain” having (200) and (400) preferential crystallographic orientations, respectively. For the determination of accurate dielectric properties of these ITO films, a thin surface layer on top of a bulk layer was considered for the spectral fits. These are done with a Drude model in the frequency range from 300 to 6000 cm−1. As a result of that, metallic behavior was verified in the MIR region for the surface and for the bulk layer. The real part of the complex dielectric function became increasingly negative toward low frequencies. The bulk layers form more than 70% of the total thickness of the films and have their plasma edges in the near-infrared. The optical properties of both surface and bulk layers strongly depend on the ITO fabrication conditions, which is enlightened by our study.

bibtex
@article{Tamanai2017,
  author   = {Akemi Tamanai, Thang Duy Dao, Michael Sendner, Tadaaki Nagao, Annemarie Pucci},
  title    = {Mid-infrared optical and electrical properties of indium tin oxide films},
  journal  = {physica status solidi a},
  year     = {2017},
  volume   = {214},
  number   = {3},
  pages    = {1600467},
  month    = {March},
  doi      = {10.1002/pssa.201600467},
  url      = {http://dx.doi.org/10.1002/pssa.201600467}
}
URL Tamanai2016
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