| Jahr | 1990 |
| Autor(en) | M.v. Schickfus, G. Baier, C. Enss |
| Titel | Glasses and Crystalline Defect Systems at Low Temperature: Dielectric Experiments |
| KIP-Nummer | HD-KIP 90-13 |
| KIP-Gruppe(n) | F3 |
| Dokumentart | |
| Quelle | Phonons 89 (S. Hunklinger, W. Ludwig, G. Weiss eds.) (Word Scientific 1990) 407-416 |
