KIP-Veröffentlichungen

Jahr 2010
Autor(en) Alexander Tadday, Patrick Eckert, Hans-Christian Schultz-Coulon, Wei Shen, Rainer Stamen
Titel Characterization Studies of Silicon Photomultipliers
KIP-Nummer HD-KIP 10-04
KIP-Gruppe(n) F11
Dokumentart Paper
Quelle NIM A620 (2010) 217
doi 10.1016/j.nima.2010.03.169
Abstract (en)

This paper describes an experimental test stand that has been developed to test and characterise properties of Silicon Photomultipliers which are of general interest, motivated by the requirements that arise with potential applications. One of the most essential properties is the ability to detect light in the application specific wavelength range with sufficiently high efficiency. Therefore, the setup allows to determine the Photon Detection Efficiency as a function of the wavelength in the spectral range from 350 to 1000 nm. The SiPM noise can be characterised by measuring the voltage dependent cross-talk and after-pulse probabilities. In addition a method is presented which allows to determine the pixel uniformity in terms of spatial variations of sensitivity and gain by raster scanning the sensitive area with a focussed laser spot. Results obtained from three HAMAMATSU MPPCs and one SensL SPM are presented and compared.

URL Science Direct
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