Jahr | 2010 |
Autor(en) | D. BADDELEY, Y. WEILAND, C. BATRAM, U. BIRK & C. CREMER |
Titel | Model based precision structural measurements on barely resolved objects |
KIP-Nummer | HD-KIP 10-01 |
KIP-Gruppe(n) | F2 |
Dokumentart | Paper |
Keywords (angezeigt) | Confocal microscopy, size estimation, model based analysis. |
Quelle | Journal of Microscopy, Volume 237, p 70 -78 |
Abstract (en) | A model based method for the accurate quantification of the |
URL | link to the article |