| Jahr | 2010 |
| Autor(en) | D. BADDELEY, Y. WEILAND, C. BATRAM, U. BIRK & C. CREMER |
| Titel | Model based precision structural measurements on barely resolved objects |
| KIP-Nummer | HD-KIP 10-01 |
| KIP-Gruppe(n) | F2 |
| Dokumentart | Paper |
| Keywords (angezeigt) | Confocal microscopy, size estimation, model based analysis. |
| Quelle | Journal of Microscopy, Volume 237, p 70 -78 |
| Abstract (en) | A model based method for the accurate quantification of the |
| URL | link to the article |