year | 2000 |
author(s) | G. Kreth, P. Edelmann, Ch. Münkel, J. Langowski, C. Cremer |
title | Confocal laser-scanning 3D fluorescence microscopy, quantitative image analysis and computer modelling of X-chromosome territories |
KIP-Nummer | HD-KIP 00-63 |
KIP-Gruppe(n) | F2 |
document type | Paper |
source | Proc. Europ. Vongress Electron Microscopy, Vol I |